Focused Ion Beam Microscope

EMA-ID CRISP
Manufacturer Zeiss
Model XB 1540
Category Focused Ion Beam (FIB)
Location D.UG2.12
Lab phone 8145

More Info:
Focused Ion Beam microscope; Cryo-stage / -transfer system; Imaging resolution 1 nm (SEM) / 7 nm (FIB); Raith Lithography System; SE2 / Inlense / BSE-detector; EBSD camera; EDX System 

Für weitere Informationen wenden Sie sich bitte an:

Michael Bräuer
Mitarbeiter/in Infrastruktur